Michael Orshansky
Cited by
Cited by
Approximate computing: An emerging paradigm for energy-efficient design
J Han, M Orshansky
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation
Y Cao, T Sato, M Orshansky, D Sylvester, C Hu
Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE …, 2000
Design for manufacturability and statistical design: a constructive approach
M Orshansky, SR Nassif, DS Boning
Springer Verlag, 2007
A general probabilistic framework for worst case timing analysis
M Orshansky, K Keutzer
Proceedings of the 39th annual Design Automation Conference, 556-561, 2002
Bulletproof: A defect-tolerant CMP switch architecture
K Constantinides, S Plaza, J Blome, B Zhang, V Bertacco, S Mahlke, ...
High-Performance Computer Architecture, 2006. The Twelfth International …, 2006
FASER: Fast analysis of soft error susceptibility for cell-based designs
B Zhang, WS Wang, M Orshansky
7th International Symposium on Quality Electronic Design (ISQED'06), 6 pp.-760, 2006
Impact of spatial intrachip gate length variability on the performance of high-speed digital circuits
M Orshansky, L Milor, P Chen, K Keutzer, C Hu
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2002
Minimization of dynamic and static power through joint assignment of threshold voltages and sizing optimization
D Nguyen, A Davare, M Orshansky, D Chinnery, B Thompson, K Keutzer
Proceedings of the 2003 international symposium on Low power electronics and …, 2003
An efficient algorithm for statistical minimization of total power under timing yield constraints
M Mani, A Devgan, M Orshansky
Proceedings of the 42nd annual Design Automation Conference, 309-314, 2005
Modeling and synthesis of quality-energy optimal approximate adders
J Miao, K He, A Gerstlauer, M Orshansky
Proceedings of the international conference on computer-aided design, 728-735, 2012
Fast statistical timing analysis handling arbitrary delay correlations
M Orshansky, A Bandyopadhyay
Proceedings of the 41st annual Design Automation Conference, 337-342, 2004
Characterization of spatial intrafield gate CD variability, its impact on circuit performance, and spatial mask-level correction
M Orshansky, L Milor, C Hu
Semiconductor Manufacturing, IEEE Transactions on 17 (1), 2-11, 2004
NBTI-aware DVFS: A new approach to saving energy and increasing processor lifetime
M Basoglu, M Orshansky, M Erez
Proceedings of the 16th ACM/IEEE international symposium on Low power …, 2010
Predictive technology model
YU Cao, T Sato, D Sylvester, M Orshansky, C Hu
Internet: http://ptm. asu. edu, 2002
Impact of systematic spatial intra-chip gate length variability on performance of high-speed digital circuits
M Orshansky, L Milor, P Chen, K Keutzer, C Hu
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided …, 2000
Analytical modeling of SRAM dynamic stability
B Zhang, A Arapostathis, S Nassif, M Orshansky
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided …, 2006
Approximate logic synthesis under general error magnitude and frequency constraints
J Miao, A Gerstlauer, M Orshansky
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 779-786, 2013
Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization
M Mani, AK Sing, M Orshansky
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided …, 2006
A new statistical optimization algorithm for gate sizing
M Mani, M Orshansky
Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004 …, 2004
Strong subthreshold current array PUF with 265challenge-response pairs resilient to machine learning attacks in 130nm CMOS
X Xi, H Zhuang, N Sun, M Orshansky
2017 Symposium on VLSI Circuits, C268-C269, 2017
The system can't perform the operation now. Try again later.
Articles 1–20