| Error moderation in low-cost machine-learning-based analog/RF testing HG Stratigopoulos, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 156 | 2008 |
| Defect filter for alternate RF test HG Stratigopoulos, S Mir, E Acar, S Ozev 2010 15th IEEE European Test Symposium, 265-270, 2010 | 100 | 2010 |
| Non-RF to RF test correlation using learning machines: A case study HGD Stratigopoulos, P Drineas, M Slamani, Y Makris 25th IEEE VLSI Test Symposium (VTS'07), 9-14, 2007 | 95 | 2007 |
| Nonlinear decision boundaries for testing analog circuits HGD Stratigopoulos, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005 | 78 | 2005 |
| RF specification test compaction using learning machines HG Stratigopoulos, P Drineas, M Slamani, Y Makris IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 998 …, 2009 | 76 | 2009 |
| Evaluation of analog/RF test measurements at the design stage HG Stratigopoulos, S Mir, A Bounceur IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009 | 74 | 2009 |
| Machine learning applications in IC testing HG Stratigopoulos 2018 IEEE 23rd European Test Symposium (ETS), 1-10, 2018 | 67 | 2018 |
| Sensors for built-in alternate RF test L Abdallah, HG Stratigopoulos, C Kelma, S Mir 2010 15th IEEE European Test Symposium, 49-54, 2010 | 66 | 2010 |
| Adaptive alternate analog test HG Stratigopoulos, S Mir IEEE Design & Test of Computers 29 (4), 71-79, 2012 | 63 | 2012 |
| Diagnosis of local spot defects in analog circuits K Huang, HG Stratigopoulos, S Mir, C Hora, Y Xing, B Kruseman IEEE Transactions on Instrumentation and Measurement 61 (10), 2701-2712, 2012 | 62 | 2012 |
| Fault diagnosis of analog circuits based on machine learning K Huang, HG Stratigopoulos, S Mir 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010 | 59 | 2010 |
| One-shot non-intrusive calibration against process variations for analog/RF circuits M Andraud, HG Stratigopoulos, E Simeu IEEE Transactions on Circuits and Systems I: Regular Papers 63 (11), 2022-2035, 2016 | 50 | 2016 |
| Estimation of analog parametric test metrics using copulas A Bounceur, S Mir, HG Stratigopoulos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011 | 45 | 2011 |
| Test metrics model for analog test development HG Stratigopoulos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012 | 44 | 2012 |
| Fast Monte Carlo-based estimation of analog parametric test metrics HG Stratigopoulos, S Sunter IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 41 | 2014 |
| Defect-oriented non-intrusive RF test using on-chip temperature sensors L Abdallah, HG Stratigopoulos, S Mir, J Altet 2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013 | 40 | 2013 |
| Experiences with non-intrusive sensors for RF built-in test L Abdallah, HG Stratigopoulos, S Mir, C Kelma 2012 IEEE International Test Conference, 1-8, 2012 | 40 | 2012 |
| Analog neural network design for RF built-in self-test D Maliuk, HG Stratigopoulos, H Huang, Y Makris 2010 IEEE International Test Conference, 1-10, 2010 | 39 | 2010 |
| Enrichment of limited training sets in machine-learning-based analog/RF test HG Stratigopoulos, S Mir, Y Makris 2009 Design, Automation & Test in Europe Conference & Exhibition, 1668-1673, 2009 | 39 | 2009 |
| MixLock: Securing mixed-signal circuits via logic locking J Leonhard, M Yasin, S Turk, MT Nabeel, MM Louërat, R Chotin-Avot, ... 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 84-89, 2019 | 38 | 2019 |
