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Alessandro Grossi
Alessandro Grossi
Senior Staff Product Engineer eNVM, Infineon Technologies
Verified email at infineon.com - Homepage
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Cited by
Year
Fundamental variability limits of filament-based RRAM
A Grossi, E Nowak, C Zambelli, C Pellissier, S Bernasconi, G Cibrario, ...
2016 IEEE International Electron Devices Meeting (IEDM), 4.7. 1-4.7. 4, 2016
1402016
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications
A Grossi, E Vianello, MM Sabry, M Barlas, L Grenouillet, J Coignus, ...
IEEE Transactions on Electron Devices 66 (3), 1281-1288, 2019
732019
Experimental investigation of 4-kb RRAM arrays programming conditions suitable for TCAM
A Grossi, E Vianello, C Zambelli, P Royer, JP Noel, B Giraud, L Perniola, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (12 …, 2018
732018
Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays
A Grossi, D Walczyk, C Zambelli, E Miranda, P Olivo, V Stikanov, A Feriani, ...
IEEE Transactions on Electron Devices 62 (8), 2502-2509, 2015
702015
Resistive RAM with multiple bits per cell: Array-level demonstration of 3 bits per cell
BQ Le, A Grossi, E Vianello, T Wu, G Lama, E Beigne, HSP Wong, S Mitra
IEEE Transactions on Electron Devices 66 (1), 641-646, 2018
662018
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms
E Pérez, A Grossi, C Zambelli, P Olivo, R Roelofs, C Wenger
IEEE Electron Device Letters 38 (2), 175-178, 2016
662016
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays
A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, C Walczyk, ...
Solid-State Electronics 115, 17-25, 2016
582016
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices
A Grossi, E Perez, C Zambelli, P Olivo, E Miranda, R Roelofs, J Woodruff, ...
Scientific reports 8 (1), 11160, 2018
422018
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays
E Pérez, A Grossi, C Zambelli, P Olivo, C Wenger
IEEE Journal of the Electron Devices Society 5 (1), 64-68, 2016
372016
Statistical analysis of resistive switching characteristics in ReRAM test arrays
C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ...
2014 international conference on microelectronic test structures (ICMTS), 27-31, 2014
372014
Relationship among current fluctuations during forming, cell-to-cell variability and reliability in RRAM arrays
A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ...
2015 IEEE International Memory Workshop (IMW), 1-4, 2015
292015
Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data
T Werner, E Vianello, O Bichler, A Grossi, E Nowak, JF Nodin, B Yvert, ...
2016 IEEE International Electron Devices Meeting (IEDM), 16.6. 1-16.6. 4, 2016
282016
Role of synaptic variability in resistive memory-based spiking neural networks with unsupervised learning
DRB Ly, A Grossi, C Fenouillet-Beranger, E Nowak, D Querlioz, ...
Journal of Physics D: Applied Physics 51 (44), 444002, 2018
272018
In-depth characterization of resistive memory-based ternary content addressable memories
DRB Ly, B Giraud, JP Noël, A Grossi, N Castellani, G Sassine, JF Nodin, ...
2018 IEEE International Electron Devices Meeting (IEDM), 20.3. 1-20.3. 4, 2018
252018
Electrical characterization of read window in ReRAM arrays under different SET/RESET cycling conditions
C Zambelli, A Grossi, P Olivo, D Walczyk, J Dabrowski, B Tillack, ...
2014 IEEE 6th International Memory Workshop (IMW), 1-4, 2014
252014
Reliability of 3D NAND flash memories
A Grossi, C Zambelli, P Olivo
3D Flash Memories, 29-62, 2016
242016
Quality-of-service implications of enhanced program algorithms for charge-trapping NAND in future solid-state drives
A Grossi, L Zuolo, F Restuccia, C Zambelli, P Olivo
IEEE Transactions on Device and Materials Reliability 15 (3), 363-369, 2015
192015
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2
A Grossi, E Perez, C Zambelli, P Olivo, C Wenger
2016 Joint International EUROSOI Workshop and International Conference on …, 2016
172016
RRAM reliability/performance characterization through array architectures investigations
C Zambelli, A Grossi, P Olivo, C Walczyk, C Wenger
2015 IEEE Computer Society Annual Symposium on VLSI, 327-332, 2015
162015
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2
A Grossi, C Zambelli, P Olivo, A Crespo-Yepes, J Martin-Martinez, ...
Solid-State Electronics 128, 187-193, 2017
152017
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