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Co-authors
- Matteo RinaldiDirector, SMART Center and Professor, Electrical and Computer Engineering, Northeastern UniversityVerified email at ece.neu.edu
- Sungho KangHardware Engineer, AppleVerified email at apple.com
- Vageeswar RajaramNortheastern UniversityVerified email at husky.neu.edu
- Yu HuiBroadcom Inc., Skyworks SolutionsVerified email at coe.neu.edu
- Sila CalisganPostdoctoral Researcher, Northeastern UniversityVerified email at northeastern.edu
- Cristian CassellaNortheastern UniversityVerified email at neu.edu
- Antea RissoPh.D. Candidate, Northeastern UniversityVerified email at northeastern.edu
- Nicol McGruerNortheastern UniversityVerified email at ece.neu.edu
- Guofeng ChenPh.D., MEMS Staff Engineer at SkyworksVerified email at northeastern.edu
- Fangze Liu 刘方泽Beijing Institute of TechnologyVerified email at bit.edu.cn
- Swastik KarNortheastern UniversityVerified email at northeastern.edu
- Flavius PopResearch Scientist at Apple Inc.Verified email at apple.com
- Yao YuTexas Instruments IncVerified email at ti.com
- Giuseppe MichettiPhD Student, Northeastern UniversityVerified email at northeastern.edu
- Bernard Herrera SoukupQualcomm Technologies Inc.Verified email at husky.neu.edu