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Daniel Farley
Daniel Farley
Ansys Germany GmbH
Verified email at ansys.com
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Cited by
Cited by
Year
Copper trace fatigue models for mechanical cycling, vibration and shock/drop of high-density PWAs
D Farley, Y Zhou, F Askari, M Al-Bassyiouni, A Dasgupta, JFJ Caers, ...
EuroSimE 2009-10th International Conference on Thermal, Mechanical and Multi …, 2009
172009
Mechanics of adhesively bonded flip-chip-on-flex assemblies. Part II: effect of bump coplanarity on manufacturability and durability of non-conducting adhesive assemblies
D Farley, A Dasgupta, JFJ Caers
Journal of adhesion science and technology 22 (14), 1757-1780, 2008
122008
Mechanics of Adhesively Bonded Flip-Chip-on-Flex Assemblies. Part I: Durability of Anisotropically Conductive Adhesive Interconnects
J Haase, D Farley, P Iyer, P Baumgartner, A Dasgupta, JFJ Caers
Journal of adhesion science and technology 22 (14), 1733-1756, 2008
82008
Qualification of a system-in-package (SiP): a physics-of-failure (PoF) perspective
D Farley, A Dasgupta, J Caers
ASME International Mechanical Engineering Congress and Exposition 47691, 321-327, 2006
52006
Fatigue model based on average cross-section strain of Cu trace cyclic bending
D Farley, A Dasgupta, Y Zhou, JFJ Caers, JWC De Vries
2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and …, 2011
42011
Qualification of SiP products: quasi-static cyclic mechanical bending
D Farley, Y Zhou, A Dasgupta, JFJ Caers, JWC De Vries
ASME International Mechanical Engineering Congress and Exposition 42991, 451-458, 2007
42007
Characterizing non-conductive adhesives using finite element analysis: Residual stress determination
D Farley, A Dasgupta, J Caers
Society of Experimental Mechanics Annual Conference & Exposition, 2005
42005
An adaptive Cu trace fatigue model based on average cross-section strain
D Farley, Y Zhou, A Dasgupta, JWC DeVries
Microelectronics Reliability 52 (11), 2763-2772, 2012
32012
Influence of fabrication parameters on bond strength of adhesively bonded flip-chip interconnects
K Sinha, D Farley, T Kahnert, SD Solares, A Dasgupta, JFJ Caers, ...
Journal of Adhesion Science and Technology 28 (12), 1167-1191, 2014
22014
Au-Au ‘cold-weld’bond strength in adhesively bonded flip-chip interconnects
K Sinha, D Farley, T Kahnert, A Dasgupta, JFJ Caers, XJ Zhao
2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and …, 2011
22011
Development of fatigue models for copper traces on printed wiring assemblies under quasi-static cyclic mechanical bending
DM Farley
University of Maryland, College Park, 2010
22010
Cold welding: A new factor governing the robustness of adhesively bonded flip-chip interconnects
D Farley, T Kahnert, K Sinha, S Solares, A Dasgupta, JFJ Caers, XJ Zhao
2009 59th Electronic Components and Technology Conference, 67-73, 2009
22009
Characterization of non-conductive adhesives
D Farley, A Dasgupta, J Caers
International Electronic Packaging Technical Conference and Exhibition 42002 …, 2005
12005
Characterization of Anisotropic Conductive Adhesives
A Dasgupta, J Caers, P Iyer, P Baumgaertner, D Farley
ASME International Mechanical Engineering Congress and Exposition 37149, 19-26, 2003
12003
Simulation and qualification of a system-in-package (SiP) based solid state lighting (SSL) module
DM Farley, F Boschman, JE Bullema, AWJ Gielen, P Hesen, ...
Thermal, Mechanical and Multi-Physics Simulation and Experiments in …, 2012
2012
System-Level Reliability Qualification of Complex Electronic Systems
D Farley, A Dasgupta, M Al-Bassyiouni, JWC de Vries
ASME International Mechanical Engineering Congress and Exposition 43789, 231-237, 2009
2009
Cold Welding Phenomenon in Adhesively Bonded Flip-Chip Interconnects
K Sinha, D Farley, T Kahnert, S Solares, A Dasgupta, JFJ Caers, XJ Zhao
ASME International Mechanical Engineering Congress and Exposition 43789, 29-34, 2009
2009
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