Follow
Robert A Reed
Robert A Reed
Verified email at vanderbilt.edu
Title
Cited by
Cited by
Year
Monte Carlo simulation of single event effects
RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ...
IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010
2792010
Impact of low-energy proton induced upsets on test methods and rate predictions
BD Sierawski, JA Pellish, RA Reed, RD Schrimpf, KM Warren, RA Weller, ...
IEEE Transactions on Nuclear Science 56 (6), 3085-3092, 2009
2172009
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
KM Warren, RA Weller, MH Mendenhall, RA Reed, DR Ball, CL Howe, ...
IEEE transactions on nuclear science 52 (6), 2125-2131, 2005
1942005
Radiation effects in advanced multiple gate and silicon-on-insulator transistors
E Simoen, M Gaillardin, P Paillet, RA Reed, RD Schrimpf, ML Alles, ...
IEEE Transactions on Nuclear Science 60 (3), 1970-1991, 2013
1472013
Impact of heavy ion energy and nuclear interactions on single-event upset and latchup in integrated circuits
PE Dodd, JR Schwank, MR Shaneyfelt, JA Felix, P Paillet, ...
IEEE Transactions on Nuclear Science 54 (6), 2303-2311, 2007
1432007
Impact of ion energy and species on single event effects analysis
RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ...
IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007
1412007
Muon-induced single event upsets in deep-submicron technology
BD Sierawski, MH Mendenhall, RA Reed, MA Clemens, RA Weller, ...
IEEE Transactions on Nuclear Science 57 (6), 3273-3278, 2010
1402010
Multiple-bit upset in 130 nm CMOS technology
AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ...
IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006
1362006
A single-event-hardened phase-locked loop fabricated in 130 nm CMOS
TD Loveless, LW Massengill, BL Bhuva, WT Holman, RA Reed, ...
IEEE transactions on nuclear science 54 (6), 2012-2020, 2007
1342007
Heavy ion and proton-induced single event multiple upset
RA Reed, MA Carts, PW Marshall, CJ Marshall, O Musseau, PJ McNulty, ...
IEEE Transactions on Nuclear Science 44 (6), 2224-2229, 1997
1331997
Effect of well and substrate potential modulation on single event pulse shape in deep submicron CMOS
S DasGupta, AF Witulski, BL Bhuva, ML Alles, RA Reed, OA Amusan, ...
IEEE Transactions on Nuclear Science 54 (6), 2407-2412, 2007
1312007
Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates
PW Marshall, MA Carts, A Campbell, D McMorrow, S Buchner, R Stewart, ...
IEEE Transactions on Nuclear Science 47 (6), 2669-2674, 2000
1192000
The effect of layout topology on single-event transient pulse quenching in a 65 nm bulk CMOS process
JR Ahlbin, MJ Gadlage, DR Ball, AW Witulski, BL Bhuva, RA Reed, ...
IEEE Transactions on Nuclear Science 57 (6), 3380-3385, 2010
1182010
Scaling trends in SET pulse widths in sub-100 nm bulk CMOS processes
MJ Gadlage, JR Ahlbin, B Narasimham, BL Bhuva, LW Massengill, ...
IEEE Transactions on Nuclear Science 57 (6), 3336-3341, 2010
1172010
Mitigation techniques for single-event-induced charge sharing in a 90-nm bulk CMOS process
OA Amusan, LW Massengill, MP Baze, BL Bhuva, AF Witulski, JD Black, ...
IEEE Transactions on device and Materials Reliability 9 (2), 311-317, 2009
1172009
Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)
P Marshall, M Carts, S Currie, R Reed, B Randall, K Fritz, K Kennedy, ...
IEEE transactions on nuclear science 52 (6), 2446-2454, 2005
1122005
Characterizing SRAM single event upset in terms of single and multiple node charge collection
JD Black, DR Ball Ii, WH Robinson, DM Fleetwood, RD Schrimpf, ...
IEEE Transactions on Nuclear Science 55 (6), 2943-2947, 2008
1092008
Fin-width dependence of ionizing radiation-induced subthreshold-swing degradation in 100-nm-gate-length FinFETs
F El Mamouni, EX Zhang, RD Schrimpf, DM Fleetwood, RA Reed, ...
IEEE Transactions on Nuclear Science 56 (6), 3250-3255, 2009
1072009
Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future
RA Reed, J Kinnison, JC Pickel, S Buchner, PW Marshall, S Kniffin, ...
IEEE Transactions on Nuclear Science 50 (3), 622-634, 2003
1062003
Emerging radiation hardness assurance (RHA) issues: a NASA approach for space flight programs
KA LaBel, AH Johnston, JL Barth, RA Reed, CE Barnes
IEEE Transactions on Nuclear Science 45 (6), 2727-2736, 1998
1061998
The system can't perform the operation now. Try again later.
Articles 1–20