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Charles Lamech
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An experimental analysis of power and delay signal-to-noise requirements for detecting Trojans and methods for achieving the required detection sensitivities
C Lamech, RM Rad, M Tehranipoor, J Plusquellic
IEEE Transactions on Information Forensics and Security 6 (3), 1170-1179, 2011
872011
Distribution Network Reconfiguration For Loss Reduction Using Ant Colony System Algorithm
LC Daniel, IH Khan, S Ravichandran
INDICON, 2005 Annual IEEE, 619-622, 2005
572005
Trojan detection based on delay variations measured using a high-precision, low-overhead embedded test structure
C Lamech, J Plusquellic
2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 75-82, 2012
452012
On detecting delay anomalies introduced by hardware trojans
D Ismari, J Plusquellic, C Lamech, S Bhunia, F Saqib
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-7, 2016
422016
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations
C Lamech, J Aarestad, J Plusquellic, R Rad, K Agarwal
Proceedings of the International Conference on Computer-Aided Design, 170-177, 2010
332010
Stability analysis of a physical unclonable function based on metal resistance variations
J Ju, R Chakraborty, C Lamech, J Plusquellic
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
312013
A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique
R Chakraborty, C Lamech, D Acharyya, J Plusquellic
Proceedings of the 50th Annual Design Automation Conference, 1-10, 2013
232013
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
J Aarestad, C Lamech, J Plusquellic, D Acharyya, K Agarwal
Proceedings of the 48th Design Automation Conference, 534-539, 2011
102011
Within-die delay variation measurement and power transient analysis using REBEL
F Saqib, D Ismari, C Lamech, J Plusquellic
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (4), 776-780, 2014
82014
A truly embedded test structure for design-for-manufacturability, hardware security and VLSI testing
CD Lamech
The University of New Mexico, 2012
2012
A Supply Voltage and Temperature Variation-Tolerant Relaxation Oscillator for Biomedical Systems Based on Dynamic Threshold and Switched Resistors........................... Z …
H Liang, W Zhang, J Huang, S Yang, P Gupta, D Rossi, M Omaņa, ...
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