Sensitivity of normality tests to non-normal data NA Ahad, TS Yin, AR Othman, CR Yaacob Sains Malaysiana 40 (6), 637-641, 2011 | 173 | 2011 |
Monitoring process mean and variability with one double EWMA chart MBC Khoo, SY Teh, Z Wu Communications in Statistics—Theory and Methods 39 (20), 3678-3694, 2010 | 74 | 2010 |
Run-sum control charts for monitoring the coefficient of variation WL Teoh, MBC Khoo, P Castagliola, WC Yeong, SY Teh European Journal of Operational Research 257 (1), 144-158, 2017 | 70 | 2017 |
A sum of squares double exponentially weighted moving average chart SY Teh, MBC Khoo, Z Wu Computers & Industrial Engineering 61 (4), 1173-1188, 2011 | 36 | 2011 |
Simultaneous monitoring of magnitude and time-between-events data with a Max-EWMA control chart RA Sanusi, SY Teh, MBC Khoo Computers & Industrial Engineering 142, 106378, 2020 | 28 | 2020 |
The variable sampling interval run sum X‾ control chart XY Chew, MBC Khoo, SY Teh, P Castagliola Computers & Industrial Engineering 90, 25-38, 2015 | 27 | 2015 |
Optimal Designs of the Median Run Length Based Double Sampling X̄ Chart for Minimizing the Average Sample Size WL Teoh, MBC Khoo, SY Teh PLoS One 8 (7), e68580, 2013 | 27 | 2013 |
Monitoring process mean and variance with a single generally weighted moving average chart SY Teh, MBC Khoo, Z Wu Communications in Statistics-Theory and Methods 41 (12), 2221-2241, 2012 | 24 | 2012 |
Monitoring of time‐between‐events with a generalized group runs control chart YY Fang, MBC Khoo, SY Teh, M Xie Quality and Reliability Engineering International 32 (3), 767-781, 2016 | 23 | 2016 |
A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean LY Lee, MBC Khoo, SY Teh, MH Lee Plos One 10 (5), e0126331, 2015 | 18 | 2015 |
Application of mean and standard deviation in questionnaire surveys AR Othman, TS Yin, S Sulaiman, MIM Ibrahim, M Razha-Rashid Menemui Matematik (Discovering Mathematics) 33 (1), 11-22, 2011 | 18 | 2011 |
The integration of FMEA with other problem solving tools: a review of enhancement opportunities WC Ng, SY Teh, HC Low, PC Teoh Journal of Physics: Conference Series 890 (1), 012139, 2017 | 16 | 2017 |
Dichotomous logistic regression with leave-one-out validation SY Teh, AR Othman, MBC Khoo International Journal of Mathematical and Computational Sciences 4 (2), 296-305, 2010 | 16 | 2010 |
Run sum chart for the mean with auxiliary information PS Ng, MBC Khoo, S Saha, SY Teh Journal of Testing and Evaluation 48 (2), 1554-1575, 2018 | 13 | 2018 |
Exact run length distribution of the double sampling X chart with estimated process parameters WL Teoh, MS Fun, SY Teh, MBC Khoo, WC Yeong South African Journal of Industrial Engineering 27 (1), 20-31, 2016 | 13 | 2016 |
The effects of parameter estimation on minimising the in-control average sample size for the double sampling X chart MBC Khoo, JY Liew, SY Teh, MH Lee, WL Teoh South African Journal of Industrial Engineering 24 (3), 58-67, 2013 | 12 | 2013 |
A STUDY ON THE EFFECTS OF TRENDS DUE TO INERTIA ON EWMA AND CUSUM CHARTS MBC KHOO, SY TEH Journal of Quality Measurement and Analysis JQMA 5 (2), 73-80, 2009 | 11 | 2009 |
Group runs double sampling np control chart for attributes ZL Chong, MBC Khoo, WL Teoh, WC Yeong, SY Teh Journal of Testing and Evaluation 45 (6), 2267-2282, 2017 | 9 | 2017 |
Application of mean and standard deviation in questionnaire surveys: Construct validation TS Yin, AR Othman, S Sulaiman, MI Mohamed-Ibrahim, M Razha-Rashid Jurnal Teknologi 78 (6-4), 2016 | 9 | 2016 |
When does the pooled variance t-test fail TS Yin, AR Othman African Journal of Mathematics and Computer Science Research 2 (4), 56-62, 2009 | 9 | 2009 |