Big data analytics for intelligent manufacturing systems: A review J Wang, C Xu, J Zhang, R Zhong Journal of Manufacturing Systems, 2021 | 208 | 2021 |
Big data analytics for forecasting cycle time in semiconductor wafer fabrication system J Wang, J Zhang International Journal of Production Research 54 (23), 7231-7244, 2016 | 110 | 2016 |
AdaBalGAN: An improved generative adversarial network with imbalanced learning for wafer defective pattern recognition J Wang, Z Yang, J Zhang, Q Zhang, WTK Chien IEEE Transactions on Semiconductor Manufacturing 32 (3), 310-319, 2019 | 109 | 2019 |
Bilateral LSTM: A two-dimensional long short-term memory model with multiply memory units for short-term cycle time forecasting in re-entrant manufacturing systems J Wang, J Zhang, X Wang IEEE Transactions on Industrial Informatics 14 (2), 748-758, 2017 | 103 | 2017 |
A collaborative architecture of the industrial internet platform for manufacturing systems J Wang, C Xu, J Zhang, J Bao, R Zhong Robotics and Computer-Integrated Manufacturing 61, 101854, 2020 | 100 | 2020 |
Deformable convolutional networks for efficient mixed-type wafer defect pattern recognition J Wang, C Xu, Z Yang, J Zhang, X Li IEEE Transactions on Semiconductor Manufacturing 33 (4), 587-596, 2020 | 92 | 2020 |
A data driven cycle time prediction with feature selection in a semiconductor wafer fabrication system J Wang, J Zhang, X Wang IEEE Transactions on Semiconductor Manufacturing 31 (1), 173-182, 2018 | 83 | 2018 |
A Hybrid CNN–LSTM Algorithm for Online Defect Recognition of CO2 Welding T Liu, J Bao, J Wang, Y Zhang Sensors 18 (12), 4369, 2018 | 75 | 2018 |
Big data driven cycle time parallel prediction for production planning in wafer manufacturing J Wang, J Yang, J Zhang, X Wang, W Zhang Enterprise information systems 12 (6), 714-732, 2018 | 56 | 2018 |
Fog-IBDIS: Industrial big data integration and sharing with fog computing for manufacturing systems J Wang, P Zheng, Y Lv, J Bao, J Zhang Engineering 5 (4), 662-670, 2019 | 48 | 2019 |
Big data analytics for cycle time related feature selection in the semiconductor wafer fabrication system J Wang, P Zheng, J Zhang Computers & Industrial Engineering 143, 106362, 2020 | 37 | 2020 |
An Unequal Learning Approach for 3D Point Cloud Segmentation J Wang, C Xu, L Dai, J Zhang, RY Zhong IEEE Transactions on Industrial Informatics 17 (12), 7913-7922, 2020 | 25 | 2020 |
Big data driven intelligent manufacturing J ZHANG, J WANG, Y LYU, J BAO China Mechanical Engineering 30 (02), 127, 2019 | 24 | 2019 |
An adaptive CGAN/IRF-based rescheduling strategy for aircraft parts remanufacturing system under dynamic environment P Zheng, J Wang, J Zhang, C Yang, Y Jin Robotics and Computer-Integrated Manufacturing 58, 230-238, 2019 | 23 | 2019 |
Anomaly detection of power consumption in yarn spinning using transfer learning C Xu, J Wang, J Zhang, X Li Computers & Industrial Engineering 152, 107015, 2021 | 21 | 2021 |
A data-driven robust optimization method for the assembly job-shop scheduling problem under uncertainty P Zheng, P Zhang, J Wang, J Zhang, C Yang, Y Jin International Journal of Computer Integrated Manufacturing 35 (10-11), 1043-1058, 2022 | 19 | 2022 |
A novel resilient scheduling paradigm integrating operation and design for manufacturing systems with uncertainties J Wang, P Zheng, W Qin, T Li, J Zhang Enterprise Information Systems 13 (4), 430-447, 2019 | 18 | 2019 |
Real-time task processing for spinning cyber-physical production systems based on edge computing S Yin, J Bao, J Zhang, J Li, J Wang, X Huang Journal of Intelligent Manufacturing 31, 2069-2087, 2020 | 17 | 2020 |
Real‐time fabric defect detection based on multi‐scale convolutional neural network S Zhao, L Yin, J Zhang, J Wang, R Zhong IET Collaborative Intelligent Manufacturing 2 (4), 189-196, 2020 | 16 | 2020 |
An explainable laser welding defect recognition method based on multi-scale class activation mapping T Liu, H Zheng, J Bao, P Zheng, J Wang, C Yang, J Gu IEEE Transactions on Instrumentation and Measurement 71, 1-12, 2022 | 12 | 2022 |