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Koustav Sinha
Koustav Sinha
Verified email at micron.com
Title
Cited by
Cited by
Year
Effect of geometric complexities and nonlinear material properties on interfacial crack behavior in electronic devices
K Sinha, J Varghese, A Dasgupta
Microelectronics Reliability 54 (3), 610-618, 2014
132014
Applications of fracture mechanics to quantitative accelerated life testing of plastic encapsulated microelectronics
JW Evans, K Sinha
Microelectronics Reliability 80, 317-327, 2018
122018
Development on fatigue life model of lead-free solder for first failure prediction
FX Che, YC Ong, HW Ng, L Pan, C Glancey, K Sinha, R Fan
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 1608-1913, 2022
72022
Methods for forming elements for microelectronic components, related conductive elements, and microelectronic components, assemblies and electronic systems incorporating such …
SU Arifeen, C Glancey, K Sinha
US Patent 11,276,659, 2022
72022
Predictive Solder Joint Reliability Modeling for Early Risk Assessment
K Sinha, C Glancey, H Takiar, YC Ong, L Pan
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC), 330-334, 2020
72020
Mechanics of Non Planar Interfaces in Flip-Chip Interconnects
K Sinha
52012
Influence of BGA design parameters on solder joint reliability
K Sinha, C Glancey
2021 IEEE 23rd electronics packaging technology conference (EPTC), 413-418, 2021
42021
Reliability engineering for driver electronics in solid-state lighting products
A Dasgupta, K Sinha, J Herzberger
Solid state lighting reliability: Components to systems, 243-284, 2013
42013
PCB design parameters of reducing copper trace crack under temperature cycle test
W Chen, P Yang, K Sinha, C Glancey, L Pan, FX Che, YC Ong
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 673-677, 2022
32022
Partial Underfill Impact Study on Solder Joint Reliability in Smartphone Application
L Pan, FX Che, YC Ong, HW Ng, K Sinha, W Chen
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 668-672, 2022
32022
Solder Joint Reliability Assessment on FO-CSP for Next Generation DDR6
V Liu, JM Chen, JA Pan, K Sinha, CL Gan, C Yoo, H Takiar
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 969-972, 2022
32022
Physics-driven Regression Algorithm on Solder Joint Fatigue Life Prediction for Mobile SiP Packages
FX Che, YC Ong, HW Ng, L Pan, K Sinha, C Glancey, G Kumar
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), 420-425, 2023
22023
Influence of fabrication parameters on bond strength of adhesively bonded flip-chip interconnects
K Sinha, D Farley, T Kahnert, SD Solares, A Dasgupta, JFJ Caers, ...
Journal of Adhesion Science and Technology 28 (12), 1167-1191, 2014
22014
Au-Au ‘cold-weld’bond strength in adhesively bonded flip-chip interconnects
K Sinha, D Farley, T Kahnert, A Dasgupta, JFJ Caers, XJ Zhao
2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and …, 2011
22011
Cold welding: A new factor governing the robustness of adhesively bonded flip-chip interconnects
D Farley, T Kahnert, K Sinha, S Solares, A Dasgupta, JFJ Caers, XJ Zhao
2009 59th Electronic Components and Technology Conference, 67-73, 2009
22009
Design optimization to Boost Solder Joint reliability Performance for SSD BGA package
L Pan, FX Che, W Yu, YC Ong, HW Ng, KAB Tan, WW Lum, K Sinha, ...
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC), 674-677, 2023
12023
Effect of Printed Circuit Board Design Parameters on Solder Joint Reliability for Memory Packages
K Sinha, C Glancey, W Chen, P Yang, L Pan, FX Che, YC Ong, HW Ng
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 622-626, 2022
12022
Semiconductor devices with flexible connector array
K Sinha, X Qu
US Patent 11,348,875, 2022
12022
Circuit board with spaces for embedding components
Q Nguyen, C Glancey, SU Arifeen, K Sinha
US Patent App. 17/023,037, 2022
12022
Mechanical strength of copper-silicon interface of planar metallization power modules
K Sinha, A Dasgupta, R Beaupre, A Gowda
ASME International Mechanical Engineering Congress and Exposition 48678, 87-93, 2008
12008
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