| Microtwinning and growth defects in GaAs MBE layers M Bafleur, A Munoz-Yague, A Rocher Journal of Crystal Growth 59 (3), 531-538, 1982 | 87 | 1982 |
| Multisource and battery-free energy harvesting architecture for aeronautics applications C Vankecke, L Assouère, A Wang, P Durand-Estèbe, F Caignet, ... IEEE transactions on power electronics 30 (6), 3215-3227, 2014 | 72 | 2014 |
| Sensitive volume and triggering criteria of SEB in classic planar VDMOS A Luu, P Austin, F Miller, N Buard, T Carrière, P Poirot, R Gaillard, ... IEEE Transactions on Nuclear Science 57 (4), 1900-1907, 2010 | 66 | 2010 |
| Analysis and compact modeling of a vertical grounded-base npn bipolar transistor used as ESD protection in a smart power technology G Bertrand, C Delage, M Bafleur, N Nolhier, JM Dorkel, Q Nguyen, ... IEEE Journal of Solid-State Circuits 36 (9), 1373-1381, 2001 | 52 | 2001 |
| Size effect on properties of varistors made from zinc oxide nanoparticles through low temperature spark plasma sintering LS Macary, ML Kahn, C Estournès, P Fau, D Trémouilles, M Bafleur, ... Advanced Functional Materials 19 (11), 1775-1783, 2009 | 44* | 2009 |
| SEB characterization of commercial power MOSFETs with backside laser and heavy ions of different ranges A Luu, F Miller, P Poirot, RÉ Gaillard, N Buard, T Carriere, P Austin, ... IEEE Transactions on Nuclear Science 55 (4), 2166-2173, 2008 | 44 | 2008 |
| CMOS current conveyor T Laopoulos, S Siskos, M Bafleur, P Givelin Electronics Letters 28 (24), 2261-2262, 1992 | 44 | 1992 |
| Implementation of thermoelectric generators in airliners for powering battery-free wireless sensor networks JM Dilhac, R Monthéard, M Bafleur, V Boitier, P Durand-Estèbe, P Tounsi Journal of electronic materials 43, 2444-2451, 2014 | 42 | 2014 |
| Substrate current protection in smart power IC's O Gonnard, G Charitat, P Lance, E Stefanov, M Suquet, M Bafleur, ... 12th International Symposium on Power Semiconductor Devices & ICs …, 2000 | 37 | 2000 |
| Application of a CMOS current mode approach to on-chip current sensing in smart power circuits P Givelin, M Bafleur, E Tournier, T Lapoulos IEE Proceedings-Circuits, Devices and Systems 142 (6), 357-363, 1995 | 37 | 1995 |
| The smart power high-side switch: description of a specific technology, its basic devices, and monitoring circuitries A Elmoznine, J Buxo, M Bafleur, P Rossel IEEE transactions on electron devices 37 (4), 1154-1161, 1990 | 37 | 1990 |
| Energy harvesting in aeronautics for battery-free wireless sensor networks JM Dilhac, M Bafleur IEEE Aerospace and Electronic Systems Magazine 29 (8), 18-22, 2014 | 36 | 2014 |
| Multi-ring active analogic protection for minority carrier injection suppression in smart power technology O Gonnard, G Charitat, P Lance, M Suquet, M Bafleur, JP Laine, ... Proceedings of the 13th International Symposium on Power Semiconductor …, 2001 | 36 | 2001 |
| Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation N Monnereau, F Caignet, D Tremouilles, N Nolhier, M Bafleur Microelectronics Reliability 53 (2), 221-228, 2013 | 34 | 2013 |
| Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs M Zerarka, P Austin, M Bafleur Microelectronics Reliability 51 (9-11), 1990-1994, 2011 | 34 | 2011 |
| ESD failure signature in capacitive RF MEMS switches J Ruan, GJ Papaioannou, N Nolhier, N Mauran, M Bafleur, F Coccetti, ... Microelectronics reliability 48 (8-9), 1237-1240, 2008 | 33 | 2008 |
| Design and applications of an easily integrable CMOS operational floating amplifier for the megahertz range TH Laopoulos, S Siskos, M Bafleur, PH Givelin, E Tournier Analog Integrated Circuits and Signal Processing 7, 103-111, 1995 | 32 | 1995 |
| Single piezoelectric transducer as strain sensor and energy harvester using time-multiplexing operation ZJ Chew, T Ruan, M Zhu, M Bafleur, JM Dilhac IEEE Transactions on Industrial Electronics 64 (12), 9646-9656, 2017 | 31 | 2017 |
| Behavioral-modeling methodology to predict Electrostatic-Discharge susceptibility failures at system level: An IBIS improvement N Monnereau, F Caignet, N Nolhier, D Trémouilles, M Bafleur 10th International Symposium on Electromagnetic Compatibility, 457-463, 2011 | 31 | 2011 |
| Energy scavenging based on transient thermal gradients: application to structural health monitoring of aircrafts N Bailly, JM Dilhac, C Escriba, C Vanhecke, N Mauran, M Bafleur 8th International Workshop on Micro and Nanotechnology for Power Generation …, 2008 | 31 | 2008 |
