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Thomas A. Germer
Thomas A. Germer
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Title
Cited by
Cited by
Year
Polarimetric BRDF in the microfacet model: Theory and measurements
RG Priest, TA Germer
Proceedings of the 2000 Meeting of the Military Sensing Symposia Specialty …, 2000
1632000
Picosecond time‐resolved adsorbate response to substrate heating: Spectroscopy and dynamics of CO/Cu (100)
TA Germer, JC Stephenson, EJ Heilweil, RR Cavanagh
The Journal of chemical physics 101 (2), 1704-1716, 1994
1631994
Goniometric optical scatter instrument for out-of-plane ellipsometry measurements
TA Germer, CC Asmail
Review of scientific Instruments 70 (9), 3688-3695, 1999
1531999
Angular dependence and polarization of out-of-plane optical scattering from particulate contamination, subsurface defects, and surface microroughness
TA Germer
Applied Optics 36 (33), 8798-8805, 1997
1271997
Detection of circular polarization in light scattered from photosynthetic microbes
WB Sparks, J Hough, TA Germer, F Chen, S DasSarma, P DasSarma, ...
Proceedings of the National Academy of Sciences 106 (19), 7816-7821, 2009
1062009
Fundamental limits of optical critical dimension metrology: a simulation study
R Silver, T Germer, R Attota, BM Barnes, B Bunday, J Allgair, E Marx, ...
Metrology, Inspection, and Process Control for Microlithography XXI 6518 …, 2007
1032007
Anisotropic, hierarchical surface patterns via surface wrinkling of nanopatterned polymer films
JH Lee, HW Ro, R Huang, P Lemaillet, TA Germer, CL Soles, CM Stafford
Nano letters 12 (11), 5995-5999, 2012
1022012
Modeling the appearance of special effect pigment coatings
TA Germer, ME Nadal
Surface Scattering and Diffraction for Advanced Metrology 4447, 77-86, 2001
972001
Size‐Monodisperse Metal Nanoparticles via Hydrogen‐Free Spray Pyrolysis
JH Kim, TA Germer, GW Mulholland, SH Ehrman
Advanced Materials 14 (7), 518-521, 2002
952002
Size‐Monodisperse Metal Nanoparticles via Hydrogen‐Free Spray Pyrolysis
JH Kim, TA Germer, GW Mulholland, SH Ehrman
Advanced Materials 14 (7), 518-521, 2002
952002
Polarization of light scattered by microrough surfaces and subsurface defects
TA Germer, CC Asmail
JOSA A 16 (6), 1326-1332, 1999
941999
Hot carrier excitation of adlayers: Time-resolved measurement of adsorbate-lattice coupling
TA Germer, JC Stephenson, EJ Heilweil, RR Cavanagh
Physical review letters 71 (20), 3327, 1993
901993
Direct characterization of the hydroxyl intermediate during reduction of oxygen on Pt (111) by time-resolved electron energy loss spectroscopy
TA Germer, W Ho
Chemical physics letters 163 (4-5), 449-454, 1989
901989
Gaps analysis for CD metrology beyond the 22nm node
B Bunday, TA Germer, V Vartanian, A Cordes, A Cepler, C Settens
Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013
892013
Picosecond measurement of substrate‐to‐adsorbate energy transfer: The frustrated translation of CO/Pt (111)
TA Germer, JC Stephenson, EJ Heilweil, RR Cavanagh
The Journal of chemical physics 98 (12), 9986-9994, 1993
881993
Modelling photovoltaic soiling losses through optical characterization
GP Smestad, TA Germer, H Alrashidi, EF Fernández, S Dey, H Brahma, ...
Scientific reports 10 (1), 58, 2020
842020
Spectrophotometry: Accurate measurement of optical properties of materials
T Germer, JC Zwinkels, BK Tsai
Elsevier, 2014
802014
Polarized light scattering by microroughness and small defects in dielectric layers
TA Germer
JOSA A 18 (6), 1279-1288, 2001
782001
Compact and robust method for full Stokes spectropolarimetry
W Sparks, TA Germer, JW MacKenty, F Snik
Applied Optics 51 (22), 5495-5511, 2012
762012
Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis
R Attota, TA Germer, RM Silver
Optics Letters 33 (17), 1990-1992, 2008
762008
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