| Knowledge-based theories of the firm in strategic management: A review and extension S Kaplan, A Schenkel, G von Krogh, C Weber International Journal of Project Management 25 (617), 143-158, 2001 | 147 | 2001 |
| Test method for random defects in electronic microstructures CM Weber US Patent 4,855,253, 1989 | 135 | 1989 |
| The evolution of patent mining: Applying bibliometrics analysis and keyword network analysis F Madani, C Weber World Patent Information 46, 32-48, 2016 | 129 | 2016 |
| Artificial markets: A review and assessment of a new venue for innovation research B Zenobia, C Weber, T Daim Technovation 29 (5), 338-350, 2009 | 83 | 2009 |
| Yield learning and the sources of profitability in semiconductor manufacturing and process development C Weber IEEE Transactions on Semiconductor Manufacturing 17 (4), 590-596, 2004 | 72 | 2004 |
| Inspection in semiconductor manufacturing KW Tobin Webster’s Encyclopedia of Electrical and Electronic Engineering 10, 242-262, 1999 | 64 | 1999 |
| An integrated framework for yield management and defect/fault reduction C Weber, B Moslehi, M Dutta IEEE Transactions on semiconductor manufacturing 8 (2), 110-120, 1995 | 34 | 1995 |
| Mask cost and profitability in photomask manufacturing: An empirical analysis CM Weber, CN Berglund, P Gabella IEEE Transactions on semiconductor manufacturing 19 (4), 465-474, 2006 | 32 | 2006 |
| Quantifying the value of ownership of yield analysis technologies C Weber, V Sankaran, KW Tobin, G Scher IEEE transactions on semiconductor manufacturing 15 (4), 411-419, 2002 | 28 | 2002 |
| Knowledge transfer and the limits to profitability: An empirical study of problem-solving practices in semiconductor manufacturing and process development C Weber IEEE Transactions on Semiconductor Manufacturing 15 (4), 420-426, 2002 | 23 | 2002 |
| Knowledge transfer and the limits to profitability: An empirical study of problem-solving practices in semiconductor manufacturing and process development C Weber IEEE Transactions on Semiconductor Manufacturing 15 (4), 420-426, 2002 | 23 | 2002 |
| Rapid learning in high-velocity environments. CM Weber | 20 | 2004 |
| Optimizing your position on the operating curve: How can a fab truly maximize its performance? CM Weber, A Fayed IEEE Transactions on Semiconductor Manufacturing 23 (1), 21-29, 2010 | 19 | 2010 |
| Enabling collaborative solutions across the semiconductor manufacturing ecosystem J Yang, CM Weber, P Gabella IEEE transactions on semiconductor manufacturing 26 (4), 465-475, 2013 | 17 | 2013 |
| Standard defect monitor C Weber Proceedings of the IEEE International Conference on Microelectronic Test …, 1988 | 17 | 1988 |
| Do learning organizations have strokes of genius? C Weber 2006 Technology Management for the Global Future-PICMET 2006 Conference 3 …, 2006 | 16 | 2006 |
| Organizational learning and capital productivity in semiconductor manufacturing CM Weber, J Yang IEEE Transactions on Semiconductor Manufacturing 27 (3), 316-326, 2014 | 15 | 2014 |
| Opening the black box of technology adoption: The motive-technology-belief framework BA Zenobia, CM Weber International Journal of Innovation and Technology Management 8 (04), 535-555, 2011 | 14 | 2011 |
| A standardized method for CMOS unit process development C Weber IEEE transactions on semiconductor manufacturing 5 (2), 94-100, 1992 | 14 | 1992 |
| Soft data analytics with fuzzy cognitive maps: modeling health technology adoption by elderly women N Rahimi, AJ Jetter, CM Weber, K Wild Advanced Data Analytics in Health, 59-74, 2018 | 12 | 2018 |
KW TobinOak Ridge Associated UniversitiesVerified email at orau.org
