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Co-authors
- Haiquan ZhaoProfessor of School of Electrical Engineering, Southwest Jiaotong UniversityVerified email at home.swjtu.edu.cn
- Rodrigo de LamareCETUC, PUC-Rio & University of YorkVerified email at york.ac.uk
- Lu LuSichuan UniversityVerified email at scu.edu.cn
- Badong ChenProfessor of Xi'an Jiaotong University, Xi'an, ChinaVerified email at mail.xjtu.edu.cn
- Hongsen HeSouthwest University of Science and TechnologyVerified email at ieee.org
- Zongsheng ZhengSichuan UniversityVerified email at scu.edu.cn
- Xiaomin Yang四川大学Verified email at scu.edu.cn
- Yuriy ZakharovUniversity of YorkVerified email at york.ac.uk
- Tao YuSouthwest Petroleum UniversityVerified email at swpu.edu.cn
- Kai-Li YinQingdao University of Science and TechnologyVerified email at qust.edu.cn
- Jacob BenestyINRS-EMT, Univ. of Quebec, CanadaVerified email at inrs.ca
- Yingsong LiAnhui UniversityVerified email at hrbeu.edu.cn
- Hongyang Chen(陈红阳), IEEE DLZhejiang Lab, ChinaVerified email at ieee.org
- Zhigang LiuProfessor, Southwest Jiaotong UniversityVerified email at home.swjtu.edu.cn
- Jianghui LiUniversity of Southampton, UKVerified email at soton.ac.uk
- Long ShiSouthwestern University of Finance and EconomicsVerified email at swufe.edu.cn