Follow
Taejoon Byun
Title
Cited by
Cited by
Year
Input prioritization for testing neural networks
T Byun, V Sharma, A Vijayakumar, S Rayadurgam, D Cofer
2019 IEEE International Conference On Artificial Intelligence Testing …, 2019
712019
Run-time assurance for learning-based aircraft taxiing
D Cofer, I Amundson, R Sattigeri, A Passi, C Boggs, E Smith, L Gilham, ...
2020 AIAA/IEEE 39th Digital Avionics Systems Conference (DASC), 1-9, 2020
282020
Manifold for machine learning assurance
T Byun, S Rayadurgam
Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020
272020
Constraint-based test generation for automotive operating systems
Y Choi, T Byun
Software & Systems Modeling 16, 7-24, 2017
212017
Run-time assurance for learning-enabled systems
D Cofer, I Amundson, R Sattigeri, A Passi, C Boggs, E Smith, L Gilham, ...
NASA Formal Methods: 12th International Symposium, NFM 2020, Moffett Field …, 2020
182020
Efficient safety checking for automotive operating systems using property-based slicing and constraint-based environment generation
Y Choi, M Park, T Byun, D Kim
Science of Computer Programming 103, 51-70, 2015
162015
Manifold-based test generation for image classifiers
T Byun, S Rayadurgam
Proceedings of the IEEE/ACM 42nd International Conference on Software …, 2020
122020
Property-based code slicing for efficient verification of osek/vdx operating systems
M Park, T Byun, Y Choi
arXiv preprint arXiv:1301.0042, 2013
102013
Toward rigorous object-code coverage criteria
T Byun, V Sharma, S Rayadurgam, S McCamant, MPE Heimdahl
2017 IEEE 28th International Symposium on Software Reliability Engineering …, 2017
82017
Automated system-level safety testing using constraint patterns for automotive operating systems
T Byun, Y Choi
Proceedings of the 30th Annual ACM Symposium on Applied Computing, 1815-1822, 2015
82015
Black-box testing of deep neural networks
T Byun, S Rayadurgam, MPE Heimdahl
2021 IEEE 32nd International Symposium on Software Reliability Engineering …, 2021
62021
Property-based testing for LG home appliances using accelerated software-in-the-loop simulation
M Park, H Jang, T Byun, Y Choi
Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020
62020
Binary Mutation Analysis of Tests Using Reassembleable Disassembly
N Emamdoost, V Sharma, T Byun, S McCamant
32019
Discovering instructions for robust binary-level coverage criteria
V Sharma, T Byun, S Rayadurgam, MPE Heimdahl
22017
Contract discovery from black-box components
V Sharma, T Byun, S McCamant, S Rayadurgam, MPE Heimdahl
Proceedings of the 1st ACM SIGSOFT International Workshop on Automated …, 2018
2018
차량전장용 운영체제 검증 사례를 통한 소프트웨어 안전성 검증 기법 소개
최윤자, 변태준
정보처리학회지 21 (4), 48-55, 2014
2014
Automatic Test Scenario Generator for OSEK/VDX-based Automotive Operating Systems
T Byun, Y Choi
Proceedings of the Korea Information Processing Society Conference, 1551-1554, 2012
2012
2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)| 978-1-6654-2587-2/21/$31.00© 2021 IEEE| DOI: 10.1109/ISSRE52982. 2021.00066
R Abreu, P Adão, SV Adve, E Al-Hossami, G An, P Arcaini, A Arcuri, ...
The system can't perform the operation now. Try again later.
Articles 1–18