Marie-Ingrid Richard
Marie-Ingrid Richard
CEA-Grenoble and ESRF
Verified email at - Homepage
Cited by
Cited by
Polarization Switching without Domain Formation at the Intrinsic Coercive Field in Ultrathin Ferroelectric
MJ Highland, TT Fister, MI Richard, DD Fong, PH Fuoss, C Thompson, ...
Physical Review Letters 105 (16), 167601, 2010
Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping
GA Chahine, MI Richard, RA Homs-Regojo, TN Tran-Caliste, D Carbone, ...
Journal of Applied Crystallography 47 (2), 762-769, 2014
Enhanced relaxation and intermixing in Ge islands grown on pit-patterned Si (001) substrates
TU Schülli, G Vastola, MI Richard, A Malachias, G Renaud, F Uhlík, ...
Physical review letters 102 (2), 025502, 2009
Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging
S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
Fast pole figure acquisition using area detectors at the DiffAbs beamline–Synchrotron SOLEIL
C Mocuta, MI Richard, J Fouet, S Stanescu, A Barbier, C Guichet, ...
Journal of applied crystallography 46 (6), 1842-1853, 2013
Enhancing the electrocatalytic activity of 2H-WS 2 for hydrogen evolution via defect engineering
L Wu, AJF Van Hoof, NY Dzade, L Gao, MI Richard, H Friedrich, ...
Physical Chemistry Chemical Physics 21 (11), 6071-6079, 2019
3D imaging of a dislocation loop at the onset of plasticity in an indented nanocrystal
M Dupraz, G Beutier, TW Cornelius, G Parry, Z Ren, S Labat, MI Richard, ...
Nano letters 17 (11), 6696-6701, 2017
The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure
SJ Leake, GA Chahine, H Djazouli, T Zhou, C Richter, J Hilhorst, L Petit, ...
Journal of Synchrotron Radiation 26 (2), 571-584, 2019
In situ synchrotron x-ray studies of strain and composition evolution during metal-organic chemical vapor deposition of InGaN
MI Richard, MJ Highland, TT Fister, A Munkholm, J Mei, SK Streiffer, ...
Applied Physics Letters 96 (5), 051911, 2010
Controlling dislocation nucleation-mediated plasticity in nanostructures via surface modification
J Shin, LY Chen, UT Sanli, G Richter, S Labat, MI Richard, T Cornelius, ...
Acta Materialia 166, 572-586, 2019
Fast computation of scattering maps of nanostructures using graphical processing units
V Favre-Nicolin, J Coraux, MI Richard, H Renevier
Journal of Applied Crystallography 44 (3), 635-640, 2011
Scanning force microscope for in situ nanofocused X-ray diffraction studies
Z Ren, F Mastropietro, A Davydok, S Langlais, MI Richard, JJ Furter, ...
Journal of Synchrotron Radiation 21 (5), 1128-1133, 2014
Evolution of crystal structure during the initial stages of ZnO atomic layer deposition
R Boichot, L Tian, MI Richard, A Crisci, A Chaker, V Cantelli, S Coindeau, ...
Chemistry of Materials 28 (2), 592-600, 2016
Imaging structure and composition homogeneity of 300 mm SiGe virtual substrates for advanced CMOS applications by scanning X-ray diffraction microscopy
MH Zoellner, MI Richard, GA Chahine, P Zaumseil, C Reich, G Capellini, ...
ACS applied materials & interfaces 7 (17), 9031-9037, 2015
Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures
V Favre-Nicolin, MG Proietti, C Leclere, NA Katcho, MI Richard, ...
The European Physical Journal Special Topics 208 (1), 189-216, 2012
Concentration and strain fields inside a Ag/Au core–shell nanowire studied by coherent X-ray diffraction
ST Haag, MI Richard, U Welzel, V Favre-Nicolin, O Balmes, G Richter, ...
Nano letters 13 (5), 1883-1889, 2013
In situ investigation of the island nucleation of Ge on Si(001) using x-ray scattering methods
TU Schülli, MI Richard, G Renaud, V Favre-Nicolin, E Wintersberger, ...
Applied physics letters 89 (14), 143114, 2006
Coherent nanoscale X-ray probe for crystal interrogation at ID01, ESRF–The European Synchrotron
SJ Leake, V Favre-Nicolin, E Zatterin, MI Richard, S Fernandez, ...
Materials & Design 119, 470-471, 2017
Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick X-ray nano-diffraction microscopy
GA Chahine, MH Zoellner, MI Richard, S Guha, C Reich, P Zaumseil, ...
Applied Physics Letters 106 (7), 071902, 2015
In situ three-dimensional reciprocal-space mapping during mechanical deformation
TW Cornelius, A Davydok, VLR Jacques, R Grifone, T Schülli, MI Richard, ...
Journal of Synchrotron Radiation 19 (5), 688-694, 2012
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