| Method for indexing and retrieving manufacturing-specific digital imagery based on image content RK Ferrell, TP Karnowski, KW Tobin Jr US Patent 6,751,343, 2004 | 182 | 2004 |
| Method for the measurement of the modulation transfer function of sampled imaging systems from bar-target patterns DN Sitter, JS Goddard, RK Ferrell Applied optics 34 (4), 746-751, 1995 | 109 | 1995 |
| Quality of Big Data in health care SR Sukumar, R Natarajan, RK Ferrell International journal of health care quality assurance, 2015 | 92 | 2015 |
| Method for localizing and isolating an errant process step KW Tobin Jr, TP Karnowski, RK Ferrell US Patent 6,535,776, 2003 | 75 | 2003 |
| ‘Big Data’collaboration: Exploring, recording and sharing enterprise knowledge SR Sukumar, RK Ferrell Information Services & Use 33 (3-4), 257-270, 2013 | 58 | 2013 |
| Baseline face detection, head pose estimation, and coarse direction detection for facial data in the SHRP2 naturalistic driving study J Paone, D Bolme, R Ferrell, D Aykac, T Karnowski 2015 IEEE Intelligent Vehicles Symposium (IV), 174-179, 2015 | 33 | 2015 |
| Content-based image retrieval for semiconductor process characterization KW Tobin, TP Karnowski, LF Arrowood, RK Ferrell, JS Goddard, ... EURASIP Journal on Advances in Signal Processing 2002 (7), 1-10, 2002 | 21 | 2002 |
| Semantic information extraction from multispectral geospatial imagery via a flexible framework S Gleason, R Ferrell, A Cheriyadat, R Vatsavai, S De 2010 IEEE International Geoscience and Remote Sensing Symposium, 166-169, 2010 | 18 | 2010 |
| Application of fractal encoding techniques for image segmentation RK Ferrell, SS Gleason, KW Tobin Jr Sixth International Conference on Quality Control by Artificial Vision 5132 …, 2003 | 17 | 2003 |
| Detection of semiconductor defects using a novel fractal encoding algorithm SS Gleason, RK Ferrell, TP Karnowski, KW Tobin Jr Design, Process Integration, and Characterization for Microelectronics 4692 …, 2002 | 16 | 2002 |
| Robust pose determination for autonomous docking JS Goddard, WB Jatko, RK Ferrell, SS Gleason Oak Ridge National Lab., TN (United States), 1995 | 12 | 1995 |
| Image retrieval in the industrial environment KW Tobin Jr, TP Karnowski, RK Ferrell Machine Vision Applications in Industrial Inspection VII 3652, 184-192, 1999 | 10 | 1999 |
| Content-based image retrieval for semiconductor manufacturing TP Karnowski, KW Tobin Jr, RK Ferrell, F Lakhani Machine Vision Applications in Industrial Inspection VIII 3966, 162-172, 2000 | 8 | 2000 |
| Content-based image retrieval for semiconductor manufacturing TP Karnowski, KW Tobin Jr, RK Ferrell, F Lakhani Machine Vision Applications in Industrial Inspection VIII 3966, 162-172, 2000 | 8 | 2000 |
| Big Data’in health care: How good is it? R Sukumar, N Ramachandran, RK Ferrell International Journal of Health Care Quality Assurance 28 (6), 621-34, 2015 | 7 | 2015 |
| Data Quality Challenges in Healthcare Claims Data: Experiences and Remedies SR Sukumar, N Ramachandran, RK Ferrell US Department of Energy, 1-14, 2014 | 3 | 2014 |
| Operator-assisted Threat Assessment: Adaptation of a Focus-of-attention Technique to the Identification of Potential Threat Regions in Carry-on Baggage Imagery RK Ferrell, KW Tobin, BA Abidi 3rd International Aviation Security Technology Symposium, Atlantic City, NJ, 2001 | 3 | 2001 |
| Traffic flow wide-area surveillance system definition GO Allgood, RK Ferrell, SW Kercel, RA Abston, CL Carnal, PI Moynihan Oak Ridge National Lab.(ORNL), Oak Ridge, TN (United States), 1994 | 3 | 1994 |
| Investigating Camera Calibration Methods for Naturalistic Driving Studies J Paone, T Karnowski, D Aykac, R Ferrell, J Goddard, A Albright Electronic Imaging 2019 (7), 461-1-461-9, 2019 | 2 | 2019 |
| Using an image retrieval system for image data management TP Karnowski, KW Tobin Jr, RK Ferrell, WB Jatko, F Lakhani Design, Process Integration, and Characterization for Microelectronics 4692 …, 2002 | 2 | 2002 |
