| An adaptive fault detection and root-cause analysis scheme for complex industrial processes using moving window KPCA and information geometric causal inference Y Sun, W Qin, Z Zhuang, H Xu Journal of Intelligent Manufacturing 32, 2007-2021, 2021 | 54 | 2021 |
| Hybrid feature selection for wafer acceptance test parameters in semiconductor manufacturing H Xu, J Zhang, Y Lv, P Zheng Ieee Access 8, 17320-17330, 2020 | 31 | 2020 |
| A multiphase information fusion strategy for data-driven quality prediction of industrial batch processes YN Sun, W Qin, HW Xu, RZ Tan, ZL Zhang, WT Shi Information Sciences 608, 81-95, 2022 | 24 | 2022 |
| Data-driven modeling and analysis based on complex network for multimode recognition of industrial processes YN Sun, ZL Zhuang, HW Xu, W Qin, MJ Feng Journal of Manufacturing Systems 62, 915-924, 2022 | 21 | 2022 |
| A causal model-inspired automatic feature-selection method for developing data-driven soft sensors in complex industrial processes YN Sun, W Qin, JH Hu, HW Xu, PZH Sun Engineering 22, 82-93, 2023 | 19 | 2023 |
| Data-driven adaptive virtual metrology for yield prediction in multibatch wafers HW Xu, W Qin, YL Lv, J Zhang IEEE Transactions on Industrial Informatics 18 (12), 9008-9016, 2022 | 17 | 2022 |
| Modelling and prediction of injection molding process using copula entropy and multi-output SVR YN Sun, Y Chen, WY Wang, HW Xu, W Qin 2021 IEEE 17th International Conference on Automation Science and …, 2021 | 10 | 2021 |
| Attention mechanism-based deep learning for heat load prediction in blast furnace ironmaking process HW Xu, W Qin, YN Sun, YL Lv, J Zhang Journal of Intelligent Manufacturing 35 (3), 1207-1220, 2024 | 6 | 2024 |
| # br# Wafer Acceptance Test Key Parameter Identification Based on Hybrid Feature Selection Method Y LYU, H XU, C ZHENG, J ZHANG, P ZHENG China Mechanical Engineering 31 (16), 1978, 2020 | 5 | 2020 |
| Wafer yield improvement based on enhanced particle swarm optimization C ZHENG, J ZHANG, Y LYU, H XU Computer Integrated Manufacturing System 29 (4), 1165, 2023 | 2 | 2023 |
| An Improved XGBoost Prediction Model for Multi-Batch Wafer Yield in Semiconductor Manufacturing HW Xu, W Qin, YN Sun IFAC-PapersOnLine 55 (10), 2162-2166, 2022 | 2 | 2022 |
| An integrated CRN-SVR approach for the quality consistency improvement in a diesel engine assembly process YN Sun, QL Chen, JH Hu, HW Xu, W Qin, XX Shen, ZL Zhuang International Journal of Computer Integrated Manufacturing, 1-16, 2023 | 1 | 2023 |
| Data-Driven Modeling of Quality-Related Multiple Indicators in Injection Molding: An Integrated JMI-MSVR Technology YN Sun, W Qin, WY Wang, HW Xu, X Shen Available at SSRN 4237371, 2022 | 1 | 2022 |
| An adaptive Copula function-based framework for fault detection in semiconductor wafer fabrication HW Xu, W Qin, YN Sun, YL Lv, J Zhang Computers & Industrial Engineering 188, 109905, 2024 | | 2024 |
| A Copula network deconvolution-based direct correlation disentangling framework for explainable fault detection in semiconductor wafer fabrication HW Xu, W Qin, JH Hu, YN Sun, YL Lv, J Zhang Advanced Engineering Informatics 59, 102272, 2024 | | 2024 |
| An Influential Node Identification Framework in the Aircraft Assembly Network Based on the Community Structure JH Hu, YN Sun, HW Xu, RZ Tan, JY Zhu, W Qin 2023 IEEE International Conference on Industrial Engineering and Engineering …, 2023 | | 2023 |
| A Data-Driven Status Division Scheme for Automated Container Terminal Production Process based on Graph Information RZ Tan, ZL Zhang, YN Sun, HW Xu, W Qin, Y Tian, D Xu 2023 IEEE 19th International Conference on Automation Science and …, 2023 | | 2023 |
| A Framework of Direct Correlation Identification for Wafer Fault Detection HW Xu, RZ Tan, QL Chen, Y Zhou, W Qin 2023 IEEE 19th International Conference on Automation Science and …, 2023 | | 2023 |
| Causality-based Prediction Method for the Diesel Engine Assembly Line System JH Hu, YN Sun, HW Xu, ZL Zhang, W Qin, XY Li 2022 IEEE 18th International Conference on Automation Science and …, 2022 | | 2022 |
| An Adaptive Threshold Strategy Based on Genetic Optimization for Nonlinear Dynamic Process Monitoring YN Sun, HW Xu, W Qin IFAC-PapersOnLine 55 (10), 2150-2155, 2022 | | 2022 |
Yan-Ning SunShanghai UniversityVerified email at shu.edu.cn
Yan-Ning SunShanghai UniversityVerified email at shu.edu.cn